Grids make for faster electron microscope work

EM Resolutions says its EM-Tec FIB grids provide a secure way to attach transmission electron microscope (TEM) lamellas to the posts during lift-out procedures with focussed ion beam (FIB) or SEM/FIB systems.

EM-Tec FIB grids from EM Resolutions

Available in various post configurations, with a shape optimised for easy accessibility, EM-Tec FIB grids are said to be compatible with all standard 3mm TEM grid holders.

These lift-out grids are available in three types: copper, molybdenum, and smooth-walled molybdenum.

The copper FIB grids are supplied in 2-, 3- or 5-post configurations.

For challenging applications, requiring high temperatures or harsh treatments, the standard molybdenum EM-Tec FIB lift-out grids are available with 2, 3, or 4 posts.

Molybdenum FIB lift-out grids inherently have some roughness of the side wall that takes valuable FIB time to smooth out before mounting a lamella.

The 3-post smooth-walled molybdenum grid saves valuable time, reducing or virtually eliminating the time needed for wall smoothing.

Each EM-Tec lift-out grid has a number corresponding to the number of posts etched into the left side of the grid, which serves to distinguish front and back.

This is combined with a series of unique symbols under each post for quick and easy identification.

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