Tag: JPK

Handbook details scanning probe microscopy accessories

A NEW catalogue of accessories for its scanning probe microscopy (SPM) systems including the NanoWizard, ForceRobot, and CellHesion has been published by JPK Instruments. Available in printed and digital (PDF) form, the 20-page handbook shows how the modular approach followed…

Atomic force imaging made easier than ever

NEW QUANTITATIVE imaging (QI) capabilities for the NanoWizard3 atomic force microscope (AFM) are said to make AFM imaging easier than ever before. JPK says the QI system gives the operator full control over the tip-sample force at each pixel on…