Category: atomic force microscopy

Nanoscale mass spectrometry boosts painting conservation

THE STUDY of cross-sections of heritage paintings has benefitted from a ‘breakthrough’ in atomic force microscopy (AFM)-based nanoscale mass spectrometry, reports Anasys Instruments. Researchers at the University of California Santa Barbara (UCSB) and the Getty Conservation Institute developed a variation…

Microscopy comes to Manchester

ORGANISERS are claiming a major success with the European Microscopy Congress 2012, held in Manchester UK this week (17-21 September 2012). Traditionally considered a meeting rooted in electron microscopy, EMC2012 had a new, ahem, focus on light microscopy thanks to…

Chemical identification at nanometre scale

ELECTRON microscopy and scanning probe microscopy offer the scientific researcher powerful high-resolution imaging at the nanometre scale, but are poor at identifying the chemical composition of the structures they image. Spectroscopy offers powerful chemical identification, but has resolution limited to…

Handbook details scanning probe microscopy accessories

A NEW catalogue of accessories for its scanning probe microscopy (SPM) systems including the NanoWizard, ForceRobot, and CellHesion has been published by JPK Instruments. Available in printed and digital (PDF) form, the 20-page handbook shows how the modular approach followed…

Atomic force imaging made easier than ever

NEW QUANTITATIVE imaging (QI) capabilities for the NanoWizard3 atomic force microscope (AFM) are said to make AFM imaging easier than ever before. JPK says the QI system gives the operator full control over the tip-sample force at each pixel on…

Understanding polymer crystallisation through AFM-IR

GROUND-breaking work on the characterisation of sub-micron polymer domains using AFM-IR has been published in the October 2011 issue of Applied Spectroscopy, a monthly journal published by the Society for Applied Spectroscopy. Written by Isao Noda of Procter and Gamble,…