EM Resolutions says its EM-Tec FIB grids provide a secure way to attach transmission electron microscope (TEM) lamellas to the posts during lift-out procedures with focussed ion beam (FIB) or SEM/FIB systems. Available in various post configurations, with a shape…
Category: electron microscope
Light microscope as ‘fast and efficient’ alternative to SEM
IN DETAILED studies for a heritage conservation project, researchers at the University of Antwerp in Belgium have found that high-resolution optical microscopy can be as powerful as scanning electron microscopy (SEM). This is the claim made by Olympus, whose DSX500…
Turbomolecular vacuum pump improves lab efficiency
THE FIRST in a new series of high performance turbomolecular vacuum pumps from Agilent, the TwisTorr 304 FS, has applications in analytical instrumentation, research programmes, and the semiconductor and nanotechnology sectors. TwisTorr 304 FS features a novel type of floating…
Winning micrograph image scores seal of approval
THE EUROPEAN Microscopy Congress, EMC2012, held last month in Manchester, UK, was used by Agar Scientific to host two competitions related to microscopy imaging. The company supported the biennial International Micrograph Competition organised by the Royal Microscopical Society, which awarded…
Particle analysis by electron microscope
THE RECENT introduction of advanced energy dispersive spectrometry (EDS) systems by Bruker has equipped the Hitachi TM3000 tabletop microscope to work alongside a Bruker Quantax 200 to perform fully automated particle analysis. In particular, two modules of Bruker’s Esprit software – the…
Most powerful electron microscope now with more resolution
A NEW objective lens option and a new scanning transmission electron microscope (STEM) version makes the Hitachi HT7700 the most powerful 120kV TEM currently available, says the company. The instrument is now suited to low accelerating voltage, high resolution examination…
Microscopy comes to Manchester
ORGANISERS are claiming a major success with the European Microscopy Congress 2012, held in Manchester UK this week (17-21 September 2012). Traditionally considered a meeting rooted in electron microscopy, EMC2012 had a new, ahem, focus on light microscopy thanks to…
Scanning electron microscope promises ‘incredible imaging’
SEEN in Europe for the first time at EMC2012 in Manchester, the Hitachi SU3500 variable pressure scanning electron microscope (VP-SEM) will deliver levels of performance previously unseen in this class of instrument, says the company. Featuring a newly designed Ultra…